EMS Provider ControlTek Announces Purchase Of SPEA Flying Probe System For PCBA Testing

Online, December 14, 2010 (Newswire.com) - EMS contract manufacturer, ControlTek continues to enhance PCBA testing capabilities with a recent purchase of the 4040 Flying Probe System made by SPEA, a leading company in Automatic Test Equipment. ControlTek selected SPEA because of their reputation for performance, speed, reliability and flexibility for automated test equipment.

"We are pleased that ControlTek has selected the SPEA platform as its flying probe test solution. The EMS market is continually being challenged to increase quality while reducing costs. With the implementation of the 4040, ControlTek has taken a step that will help them achieve those goals," states Rick Brummett, SPEA's Regional Manager. (http://www.spea.com)

The SPEA 4040's unique board loading design allows virtually any board configuration to be mounted into the system without the added NRE for fixturing or board carriers. This results in a fast turnaround time on new board development at a lower cost. The 4040 addition exemplifies ControlTek's overall dedication to strategic, economical test solutions for their customers. Adding a machine that offers the highest level of capability available greatly improves ControlTek's ability to get customer products to market faster. (http://www.controltek.com/capabilities/manufacturing_test_services.php)

ControlTek VP of Operations, Sean Neill, is enthusiastic about what the new test equipment means to ControlTek customers, "Time to market is important to us and to our customers. The SPEA 4040 gets product to market faster by reducing debug & development time while controlling costs. Additionally, the flying probe will complement ControlTek's existing automated optical inspection, ICT and functional test services."

The SPEA 4040 Flying Probe System's optical encoders and frictionless linear motors use an air bearing technology that results in extremely fast probe movement and eliminates any wear factor that can cause inaccuracies in probe positioning. The system is capable of targeting fine pitch components such as 01005, 0201 and RQFP's and provides implementation of multiple test techniques such as parametric, functional, boundary scan, optical inspection and open pin testing on digital devices and connectors.