Powerful USB Digital Pattern Generators at DesignCon 2011

Online, January 19, 2011 (Newswire.com) - Testing and debugging embedded electronic systems has become one of the most time-consuming and critical tasks during system development. Chips designers all over the world are beginning to discover that, from the early prototype stage through to final test, a Digital Pattern Generator (DPG) speeds up design debug, reduces cost and rework, and therefore shortens the overall product design cycle.

Testing a design basically requires two tasks: 1) Generating an input stimulus to the system, and 2) Analyzing the system's response. To solve the 'stimulus-and-response' challenge an engineer can save valuable design time with the right equipment. There is no doubt that oscilloscopes, logic analyzers and perhaps more specialized analyzers will help doing the 'analysis task'.

While each of these instruments have their place, many engineers are discovering that Digital Pattern Generators are essential for anyone involved in electronics design - they improve the speed of semiconductor and digital system testing - especially during the design phase - and hence tackle two vital commodities - Cost and Time-to-Market.

Byte Paradigm, a leading European embedded test equipment manufacturer, will demonstrate the use of Digital Pattern Generators at DesignCon 2011 (Feb. 1- 2 in San Jose, CA).